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| === Defined Terms ===
| | <big><big><big>'''[http://web.archive.org/web/19980515033256/www.asms.org/TermsDefsPoster.html 1997 Terms and Definitions Poster]''' (Internet Archive)</big></big></big> |
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| ==== Analyzers ====
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| Double Focusing
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| Tandem Mass Spectrometry (Ms/Ms)
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| Ion Trap Analyzer
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| Paul Ion Trap
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| Penning Ion Trap
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| Fourier Transform Ion Cyclotron Resonance (Fticr) Analyzer
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| Double Resonance
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| Cyclotron Motion
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| Magnetron Motion
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| Time-Of-Flight Mass Spectrometer
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| Reflectron
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| Single-Stage Reflectron
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| Dual-Stage Reflectron.
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| Isotopic Peak(Ion)
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| Isobaric Peak(Ion)
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| Mass Spectrum
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| Mass-To-Charge Ratio (M/Z)
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| Mass Spectrometry
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| Mass Selective Detector
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| Mathieu Stability Diagram
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| Secondary Ion Mass Spectrometry
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| Flowing Afterglow
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| High Pressure Pulsed Ms
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| ==== Sample Introduction ====
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| Ion Source
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| Gas Chromatography-Mass Spectrometry (Gc-Ms)
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| Desorption Ionization
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| Spray Ionization
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| Liquid Chromatography-Mass Spectrometry (Lc-Ms)
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| Ce/Ms
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| Cec/Ms
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| Ce/Ms Interface
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| Layer Flow Interface
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| Liquid Junction Interface
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| Ion Molecule Reactions
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| ==== Ion Molecule Reactions ====
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| Collision-Induced Dissociation
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| Inelastic Collision
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| ==== Ionization Nomenclature ====
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| Radical Ion (Odd-Electron Ion)
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| Odd-Electron Ion
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| Parent Ion (M1+)
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| Product Ion (M2+)
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| Metastable Ion
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| Surface-Induced Dissociation
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| Ionization Energy(Ie)
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| Glow Discharge
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| Inductively Coupled Plasma
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| Electron Affinity
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| Proton Affinity
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| Electron Capture
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| Electron Impact
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| Even-Electron Ion
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| Distribution Of Internal Energy
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| Resonance Electron Capture Of Thermal Electrons
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| Appearance Energy
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| Atmospheric Pressure Ionization (Api)
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| Atmospheric Pressure Chemical Ionization (Apci)
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| Chemical Ionization
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| Breakdown Curve
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| Charge Exchange
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| Spray Ionization
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| Electrospray Ionization (Esi)
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| Ion Evaporation
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| Pneumatically Assisted Electrospray
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| Ion Spray
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| Ion Spray
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| Thermospray
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| Particle Beam
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| Thermobeam (or Thermabeam)
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| MAGIC (Mono Disperse Aerosol Generation Interface For Combined LC/MS)
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| LC/MS Interfaces
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| Eh
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| Thermal Ionization
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| Unimolecular Rate Constant K
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| Reconstructed Ion Chromatogram (Ric)
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| Selected Ion Monitoring (Sim)
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| Base Peak
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| Relative Abundance( Ra)
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| Neutral Loss Scan
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| Parent Ion
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| Parent Scan
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| Product Ion Scan
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| Distonic Ion
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| Fragmentation Pattern
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| Fragment Ion
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| Ion Internal Energy
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| Molecular Ion
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| Multiple-Charged Ions
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| Photodissociation
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| Charge-Remote Fragmentation (Remote Site Fragmentation)
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| Mass Resolution
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| Mass Resolving Power
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| Theoretical Mass Resolving Power
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| [[Category:Information]] | | [[Category:Information]] |
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| [[Category:Presentation]] | | [[Category:Presentation]] |
A poster presented 6/2/97 at the ASMS Conference in Palm Springs, CA by the Measurements and Standards Committee (Robert Voyksner, Philip Price, John Bartmess, James Little, and David Wang-Iverson).
A version of the poster was on the ASMS Website between 1998 and 2000.
1997 Terms and Definitions Poster (Internet Archive)
