Secondary ion mass spectrometry: Difference between revisions

Revision as of 13:10, 8 January 2014

Secondary ion mass spectrometry
IUPAC RECOMMENDATIONS 2013
Technique in which a focused beam of primary ions produces secondary ions by sputtering from a solid surface. The secondary ions are analyzed by mass spectrometry.
Related Term(s): dynamic secondary ion mass spectrometry (DSIMS)
Reference(s): A. Benninghoven, B. Hagenhoff, E. Niehuis. Anal. Chem. 65, 630A (1993).
From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013.
Index of Recommended Terms

@@ Line 1: / Line 1: @@
-{{DefName|
+{{Final
-See [[secondary ionization]].
+|acronym=
+|def=Technique in which a focused beam of primary [[ion]]s produces [[secondary ion]]s by sputtering from a solid surface. The secondary ions are analyzed by [[mass spectrometry]].
+|rel=[[dynamic secondary ion mass spectrometry]] ([[DSIMS]])
+|ref=A. Benninghoven, B. Hagenhoff, E. Niehuis. Anal. Chem. 65, 630A (1993).
 }}
-{{asms|
-Mass spectrometry based on analysis of particles that are emitted when a surface, usually a solid, although sometimes a liquid, is bombarded by energetic (~ keV) primary particles (e.g. Ar+ and Cs+).
-}}
-== See also ==
-*[[Fast Atom Bombardment Ionization]]
-== External links ==
-* [http://www.asms.org/whatisms/index.html ASMS What is MS?]: [http://www.asms.org/whatisms/p11.html What Other Techniques are Used to Produce Ions?]
-*[[Wikipedia:Secondary ion mass spectrometry]]
-*[[Wikipedia:Fast atom bombardment]]
 [[Category:Ionization]]
-{{DEFAULTSORT:Secondary Ion Mass Spectrometry}}