Secondary ion mass spectrometry: Difference between revisions
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Mass spectrometry based on analysis of particles that are emitted when a surface, usually a solid, although sometimes a liquid, is bombarded by energetic (~ keV) primary particles (e.g. Ar+ and Cs+). | |||
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== See also == | == See also == | ||
*[[Fast Atom Bombardment Ionization]] | *[[Fast Atom Bombardment Ionization]] | ||
Revision as of 21:13, 18 July 2009
| DRAFT DEFINITION |
| Secondary ion mass spectrometry |
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See secondary ionization. |
| Considered between 2004 and 2006 but not included in the 2006 PAC submission |
| This is an unofficial draft definition presented for information and comment. |
| ASMS TERMS AND DEFINITIONS POSTER ENTRY |
| Secondary ion mass spectrometry |
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Mass spectrometry based on analysis of particles that are emitted when a surface, usually a solid, although sometimes a liquid, is bombarded by energetic (~ keV) primary particles (e.g. Ar+ and Cs+). |
| ASMS Terms and Definitions Poster |
