Direct exposure probe: Difference between revisions
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Device based on a modification of a [[direct insertion probe]] for exposing an involatile sample directly to the electron beam (in an [[electron ionization]] source) or to a [[chemical ionization]] plasma as in [[desorption chemical ionization]]. The sample can be deposited on an inert surface | |def=Device based on a modification of a [[direct insertion probe]] for exposing an involatile sample directly to the electron beam (in an [[electron ionization]] source) or to a [[chemical ionization]] plasma as in [[desorption chemical ionization]]. | ||
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:''Note:'' The sample can be deposited on an inert surface or on a heater filament for rapid heating. | |||
|ref=M. Vincenti. Int. J. Mass Spectrom. 212, 505 (2001). | |||
R. J. Cotter. Anal. Chem. 51, 317 (1979). (http://dx.doi.org/10.1021/ac50038a045 ) | |||
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[[Category:sample introduction]] | |||
Latest revision as of 16:56, 1 April 2024
| IUPAC RECOMMENDATIONS 2013 |
| Direct exposure probe (DEP) |
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Device based on a modification of a direct insertion probe for exposing an involatile sample directly to the electron beam (in an electron ionization source) or to a chemical ionization plasma as in desorption chemical ionization.
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| Related Term(s): {{{rel}}} |
| Reference(s):
M. Vincenti. Int. J. Mass Spectrom. 212, 505 (2001). R. J. Cotter. Anal. Chem. 51, 317 (1979). (http://dx.doi.org/10.1021/ac50038a045 ) |
| From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |
