Secondary electron: Difference between revisions
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{{ | {{Final | ||
Electrons | |acronym= | ||
|def=Electrons ejected from a sample surface as a result of bombardment by a primary beam of atoms, [[ion]]s, electrons, or photons. | |||
|rel= | |||
|ref=M. Van Gorkom, R. E. Glick. Int. J. Mass Spectrom. Ion Phys. 4, 203 (1970). (http://dx.doi.org/10.1016/0020-7381(70)85038-0 ) | |||
}} | }} | ||
[[Category:Detection]] | [[Category:Detection]] | ||
Latest revision as of 12:49, 8 January 2014
| IUPAC RECOMMENDATIONS 2013 |
| Secondary electron |
|---|
| Electrons ejected from a sample surface as a result of bombardment by a primary beam of atoms, ions, electrons, or photons. |
| Related Term(s): |
| Reference(s):
M. Van Gorkom, R. E. Glick. Int. J. Mass Spectrom. Ion Phys. 4, 203 (1970). (http://dx.doi.org/10.1016/0020-7381(70)85038-0 ) |
| From Definitions of Terms Relating to Mass Spectrometry (IUPAC Recommendations 2013); DOI: 10.1351/PAC-REC-06-04-06 © IUPAC 2013. |
